Model 520 FT-IR Spectrometer

Features:
Adopting cube-corner Michelson interferometer with higher stability and less sensitive to vibrations and thermal variations than conventional interferometer.
Fully sealed damp-proof interferometer ensures higher adaptability to the environment.
Outside IR source design provides even high thermal stability with no need of dynamic adjustment.
High intensity IR source adopts a reflex sphere to obtain even and stable IR radiation.
An optional external beam allows access to the widest variety of high sensitive peripheral sampling system, such as GC/IR interface and FTIR microscope.
The spectrometer connects to PC through a USB interface to realize automatic control and data communication.
Compatible computer and various application software with IR libraries.
The sampling compartment is wide enough for various accessories such as defused/Specular Reflection, Horizontal ATR, Variable Angle ATR, Liquid cell and Gas cell.

Specifications:
Spectral Range:
7800 to 400 cm^-1
Resolution:
Better than 0.5cm^-1
Wavenumber Precision:
+_0.01cm^-1
Scanning Speed:
0.2~2.5 cm^-1/s, Automatically optimized for detector type or manually adjustable for specific applications
Signal to noise ratio:
better than 15,000:1 (RMS value, at 2100cm^-1, resolution: 4cm^-1, detector: DTGS, 1minute data collection)
Beam splitter:
Ge coated KBr
Infrared Source:
External, air-cooled, high efficiency Reflex Sphere module
Detector:
DTGS, MCT (optional)
Data system:
Compatible computer
Software:
FT-IR software contains all routines needed for basic spectrometer operations.